Recent Publications

Allison, H.D., N.D. Dowling and R.W. Hendricks
Evaluation of the Role of Shot Peening and Agining Treatments on Residual Stresses and Fatigue Life of an Aluminum Alloy,
in Proc. of MAT-TEX 93 Improvement of Materials, T. Ericcson, G. Pluvinage and L. Castex, eds., Detroit, MI, October, 1993, (Sournay sur Marne, France: IITT-International, 1993), pp. 35--40.
Courtney, S.B., M.J. Tricard and R.W. Hendricks
PC-based Management and Analysis of X-ray Scattering Residual Stress Data,
in Adv. X-ray Analys., 36, (New York: Plenum, 1993), pp. 535--541.
Ward, A., R.W. Hendricks and M. Brauss
RS/hyper: A Hypertext-based Workstation for Reliable X-ray Residual Stress Measurements,
in Adv. X-ray Analys., 36, (New York: Plenum, 1993), pp. 527--533.
Ward, A., K.L. Venzant and R.W. Hendricks
Residual Stress Analysis of Different Microstructures in Alumina Microelectronic Substrates,
in Adv. X-ray Analys., 37, (New York: Plenum, 1994), pp. 291--298.
Ward, A. and R.W. Hendricks
The Phi Error Analysis: a Method to Interpret Oscillatory X-ray Stress Data,
Proc. Fourth International Conf. on Residual Stress, M.R. James, ed., Baltimore, MD, June, 1994, (Bethel, CT: Soc. for Experim. Mech., 1994), pp. 235--244.
Ward, A., H.D. Allison, B. Zimmerman, and R.W. Hendricks
Sample Curvature Effects on d-versus sin²(psi) Plots for Residual Stress Analysis,
Adv. X-Ray Analysis, New York: Plenum; (1997), pp. 291--296.
Ward, A. and R.W. Hendricks
Residual Stress in Si₃N₄-Passivated GaAs Wafers,
Adv. X-ray Analys., 39, (New York: Plenum, 1995), pp. 289--295.
Allison, H.D., and R.W. Hendricks
Visuallization of Errors in Residual Stresses,
Adv. X-ray Analysis, New York: Plenum; 1997: pp 305--310.
Hendricks, R.W., and E.C. Pappas
Writing and Communications Across the Curriculum in the Materials Science and Engineering Department at Virginia Tech,
in Engineering Education for the 21st Century, Proc. Frontiers in Education 25th Annual Conference, Atlanta, Georgia, (1995).
Hendricks, R.W., and E.C. Pappas
An Integrated Writing and Communications Program for Materials Engineers,
J. Eng. Ed., 85(4), Oct 1996, pp. 343-352.
Gao, H., H. Guo, J.M. Blackburn, and R.W. Hendricks
Determination of Residual Stress by X-Ray Diffraction in HSLA-100 Steel Weldments,
in: Ericsson, T.; Odén, M., and Andersson, A., eds. Fifth International Conference on Residual Stresses; 1997 Jun 16-1997 Jun 18; Linköping, Sweden. Linköping, Sweden: Linkopings Universitet; (1998), pp. 320--325.
Allison, H.D., and R.W. Hendricks
Correlation of Barkhausen Noise Signal and X-ray Residual Stress Determination in Grinding-Burned 52100 Steel,
in: Ericsson, T.; Odén, M., and Andersson, A., eds. Fifth International Conference on Residual Stresses; 1997 Jun 16-1997 Jun 18; Linköping, Sweden. Linköping, Sweden: Linkopings Universitet; (1998), pp. 640--645.
Guo, H., H. Gao, R.W. Hendricks, R.K. Batra, Y. Lavin, Y. Levy, and L. Hesselink
Visualization of Triaxial Residual Stress Tensors Near Welds in HSLA-100 Steel,
in: Ericsson, T.; Odén, M., and Andersson, A., eds. Fifth International Conference on Residual Stresses; 1997 Jun 16-1997 Jun 18; Linköping, Sweden. Linköping, Sweden: Linkopings Universitet; (1998), pp. 810--816.
Ward, A., and R.W. Hendricks
Micron-Scale Strain Determination in III-V Semiconductor Devices by Computer Simulation and X-Ray Diffraction,
in: Ericsson, T.; Odén, M., and Andersson, A., eds. Fifth International Conference on Residual Stresses; 1997 Jun 16-1997 Jun 18; Linköping, Sweden. Linköping, Sweden: Linkopings Universitet; (1998), pp. 1054--1059.
Ward, A., and R.W. Hendricks
Process-Induced Stress and Microcrack Nucleation in GaAs Wafers,
J. Electronic Mat., 27(7), (1997), pp. 821-825.
Ward, A., and R.W. Hendricks
Symptoms of Stress Induced Gain Degradation in Sub-Micron Power MESFETs,
J. Electronic Mat., 27(7), (1997), pp. 826-828.
Pappas, E.C., and R.W. Hendricks
Holistic Grading in Science and Engineering,
J. Eng. Ed., 89(4), (2000), pp. 403 - 408.

The Guidelines described in Appendices A - C are available as a stand-alone file.
Hendricks, R.W.
A Undergraduate Microchip Fabrication Facility,
Proceedings ASEE 2001 Annual Meeting (to be published)
Timmons, C.T., D.T. Gray, and R.W. Hendricks
Process Development for an Undergraduate Microchip Fabrication Facility
Proceedings ASEE 2001 Annual Meeting (to be published)
Eckerman, P.D., and R.W. Hendricks
A Laboratory Information Management System (LIMS) for an Undergraduate Microchip Fabrication Facility
Proceedings ASEE 2001 Annual Meeting (to be published)
R.W. Hendricks, L.J. Guido, R.A. Heflin, and S.C. Sarin
An Interdisciplinary Curriculum for Microelectronics
Proceedings ASEE 2001 Annual Meeting (to be published)
E.C. Pappas and R.W. Hendricks
An Update: The Materials Science and Engineering Advanced Engineering Communications Program at Virginia Tech
(submitted to J. eng. Ed., 2001)
E.C. Pappas, R.W. Hendricks, and J. Franks
Satisfying the Non-technical ABET "a-k" Requirements: the Virginia Tech Materials Science and Engineering Communications Portfolio
Proc. 2001 ASEE Southeast Section Conference
C.S. French, D.P. Belman, D.E. Kardes, and R.W. Hendricks
Determination of Junction Depths for Phosphorous Diffused in Silicon
Proc. 14^th IEEE Biennial University/Government/Industry Microelectronics (UGIM) Symposium held in Richmond, Virginia, June 17-20, 2001.
D.S. Myers, J.L. Meyer, P. DePasquale, and R.W. Hendricks
An Interactive Program for Determining Junctions Depths in Diffused Silicon Devices
Proc. 14^th IEEE Biennial University/Government/Industry Microelectronics (UGIM) Symposium held in Richmond, Virginia, June 17-20, 2001.
P.D. Eckerman and R.W. Hendricks
Wafer Traveler Design for an Undergraduate Microchip Fabrication Facility
Proc. 14^th IEEE Biennial University/Government/Industry Microelectronics (UGIM) Symposium held in Richmond, Virginia, June 17-20, 2001.